首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
QUANTITATIVE DETERMINATION OF FINE PARTICLE BY MEASURING FLUORESCENT INTENSITY
摘要
申请公布号
JPS6336151(A)
申请公布日期
1988.02.16
申请号
JP19860177829
申请日期
1986.07.30
申请人
SHOWA DENKO KK
发明人
MIZUKOSHI TATSUYA;FUKUI KATSUJI
分类号
G01N33/543
主分类号
G01N33/543
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Low cost electromechanical electronic simulation circuits
CAPILLARY DEVICE FOR WIRE BONDING
MANUFACTURE OF SIMPLE PRESS DIE
BURIED CONSTRUCTION DISTRIBUTION REFLECTION TYPE SEMICONDUCTOR LASER AND ITS MANUFACTURE
FORMATION OF DIELECTRIC MULTILAYER FILM
SEMICONDUCTOR DEVICE
SEMICONDUCTOR DEVICE
FORMATION OF CAST OF WELDING WIRE
CONTINUOUS CASTING METHOD OF HIGH GRADE STEEL
SEMICONDUCTOR LASER DEVICE
MANUFACTURE OF LEAD FRAME FOR SEMICONDUCTOR DEVICE
PATTERN FORMATION
PRODUCTION OF CORROSION RESISTANT SILVER ALLOY DECORATIVE PARTS
METHOD FOR ANNEALING WIRE FOR WELDING
TREATING DEVICE OF DILUTE ELECTROLYTE SOLUTION
CONNECTING METHOD OF HEATER FOR VACUUM DEGASSING VESSEL
STABILIZATION WORK OF GROUND'S SURFACE LAYER
OIL HOLE PROCESSING DEVICE FOR CRANKSHAFT
NUMERICAL CONTROL DEVICE
METHOD OF PRODUCING MULTILAYER CERAMIC CIRCUIT BOARD
