发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce the number of steps and to integrate a Bi-CMOS semiconductor integrated circuit by using a high melting point metal material such as polysilicon as a mask for introducing impurity of an MOS transistor and a bipolar transistor. CONSTITUTION:A polysilicon film 10 is formed on a field oxidized film 8 and a gate oxidized film 9, pattern etching is executed, and with the films, 10, 8 as masks arsenic ions As are implanted to form an N type source region 11, an N type drain 12 of an NMOS transistor, and an N type emitter region 13 and an N type collector contacting region 14 of a bipolar transistor. Then, with the photoresist 15, a field oxidized film 18 and the film 10 as masks boron ions B are implanted, thereby forming a P type source region 16, a P type drain region 17 of a PMOS transistor and a P type base region 18 of a bipolar transistor.
申请公布号 JPS6017943(A) 申请公布日期 1985.01.29
申请号 JP19830125309 申请日期 1983.07.08
申请人 MATSUSHITA DENSHI KOGYO KK 发明人 SATOU KAZUO;KIMURA TAKESHI
分类号 H01L27/092;H01L21/8238;H01L21/8249;H01L27/06;(IPC1-7):H01L27/06;H01L27/08 主分类号 H01L27/092
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