发明名称 TIME-OF-FLIGHT MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To provide a time-of-flight mass spectrometer without lowering the resolving power even if the ion of sample gas separated at a gas chromatograph device is introduced in an ion reservoir. SOLUTION: The time-of-flight mass spectrometer comprises an ion source for ionizing the sample flowing out from the gas chromatograph device; an ion guide installed at a rear stage of the ion source for guiding the generated ion, a differential exhaust orifice installed at the rear stage of the ion guide for taking the guided ion into a high vacuum area, an incident beam regulation slit installed at the rear stage of the differential exhaust orifice for regulating the shape of the incident beam, an ion beam convergence/deflection means installed at the rear stage of the incident beam regulation slit composed of a pair of flat electrodes facing each other, an electric field shield installed at the rear stage of the ion beam convergence/deflection means for shielding the electric field leaked from the ion beam convergence/deflection means, and the ion reservoir installed at the rear stage of the electric field shield. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004362902(A) 申请公布日期 2004.12.24
申请号 JP20030158814 申请日期 2003.06.04
申请人 JEOL LTD 发明人 IWANAGA MITSUYASU;KOBAYASHI TATSUJI
分类号 G01N27/62;H01J49/06;H01J49/40;(IPC1-7):H01J49/40 主分类号 G01N27/62
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