发明名称 METHOD FOR CLEANING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for cleaning a semiconductor device is provided to increase throughput and improve economical efficiency caused by collection of NH3 by using a super critical technology in cleaning a memory device and a non-memory device. CONSTITUTION: When a cassette(6) is mounted on a cassette container(2), super critical liquid is injected from an ammonia container to the cassette container. A cleaning process and a scrubbing process are performed in a state of high temperature and high pressure on the super critical liquid induced to the cassette container. All gas after the cleaning process and scrubbing process is induced to an ammonia collecting container(4) of a low temperature state. After the temperature and pressure of the ammonia collecting container is reduced to separate ammonia of a gas phase from ammonia of a liquid phase, purging gas of a purging gas container(3) of a high pressure is pushed to an ammonia storing container(1) and ammonia of a gas phase is exhausted to the ammonia collecting container so that ammonia gas is reused.
申请公布号 KR100417647(B1) 申请公布日期 2004.01.27
申请号 KR19960075182 申请日期 1996.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, CHEOL MO;KIM, U HYEON
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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