<p>PURPOSE: A method for manufacturing a semiconductor device is provided to obtain an expanded sigma profile by selectively eliminating a part of a sigma profile. CONSTITUTION: A semiconductor substrate(101) includes a silicon substrate. A gate electrode(119) is formed on the surface of the semiconductor substrate. A first trench including a first tip is formed on the semiconductor substrate. The first trench is expanded. A second trench including a second tip is formed on the surface of the semiconductor substrate.</p>
申请公布号
KR20120108338(A)
申请公布日期
2012.10.05
申请号
KR20110026053
申请日期
2011.03.23
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, DONG HYUK;SHIN, DONG SUK;KIM, MYUNG SUN;CHUNG, HOI SUNG