<p>The interferometer has a beam splitter (2) which divides light from a light source (1) into measuring and reference beams propagating in the measurement and reference arms. A measuring reflector (3) causes an offset between the incident and the back reflected measuring beams. A detector array (7) generates distance-dependent interference signal with respect to position of measuring reflector based on superimposed and combined measurement and reference beam bundles (M,R). The measurement reflector is equipped with a transmission grating and a reflector element.</p>
申请公布号
EP2746718(B1)
申请公布日期
2015.11.04
申请号
EP20130195461
申请日期
2013.12.03
申请人
DR. JOHANNES HEIDENHAIN GMBH
发明人
HOLZAPFEL, WOLFGANG;DRESCHER, JÖRG;MEISSNER, MARKUS;JOERGER, RALPH;MUSCH, BERNHARD;SPANNER, ERWIN;KÄLBERER, THOMAS