| 摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of an A/D conversion circuit whereby a time for discriminating occurrence of a fault of a pulse selector can be decreased in an inspection step of the A/D conversion circuit. SOLUTION: A first D-FF 8 composes digital data each generated by an encoder 7 and a counter 4 to generate digital data D2, which are outputted to a second D-FF 9 and a subtractor circuit 11. Further, the second D-FF 9 outputs digital data D1 representing "0" to the subtractor circuit 11 by inputting a TEST signal to an OR gate 10 to reset the second D-FF 9. Moreover, the subtractor circuit 11 subtracts the digital data D1 representing "0" from the digital data D2 and externally outputs the results as digital data TD. Thereafter, analysis of the digital data TD comprising only the digital data D2 externally outputted discriminates a defect of the pulse selector 6. COPYRIGHT: (C)2007,JPO&INPIT
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