发明名称 Pixel array with reduced sensitivity to defects
摘要 An array of active pixels comprises rows of pixels and row select lines for selecting rows of pixels. Each active pixel comprises a buffer amplifier for buffering an output of a photo-sensitive element. An output of the buffer amplifier can be selectively put into a high impedance state, by control of the input of the buffer amplifier, when there is a defect in the row select line for that pixel. This allows other rows, which are defect-free, to remain operating as normal. A disable line can be provided for a row of pixels and each pixel can have a switch connected to the disable line. Alternatively, a first supply line powers a row of pixels. Each pixel comprises a reset switch connected between a photo-sensitive element and the first supply line for resetting the photo-sensitive element. The array is configured such that, in the event of a defect in a row select line, the first supply line is set to ground, or a low voltage, and the reset switch is turned on to put the buffer amplifier into the high impedance state.
申请公布号 EP2076018(B1) 申请公布日期 2014.10.08
申请号 EP20080162190 申请日期 2008.08.11
申请人 CMOSIS NV 发明人 MEYNANTS, GUY
分类号 H04N5/3745;H04N5/367;H04N5/374 主分类号 H04N5/3745
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