发明名称 Composite Wafer and a Method for Manufacturing Same
摘要 A composite wafer includes a substrate and a SiC-based functional layer. The substrate includes a porous carbon substrate core and an encapsulating layer encapsulating the substrate core. The SiC-based functional layer comprises, at an interface region with the encapsulating layer, at least one of: a carbide and a silicide formed by reaction of a portion of the SiC-based functional layer with a carbide-and-silicide-forming metal. An amount of the carbide-and-silicide-forming metal, integrated over the thickness of the functional layer, is 10−4 mg/cm2 to 0.1 mg/cm2.
申请公布号 US2014225125(A1) 申请公布日期 2014.08.14
申请号 US201313765102 申请日期 2013.02.12
申请人 INFINEON TECHNOLOGIES AG 发明人 Berger Rudolf;Schulze Hans-Joachim;Mauder Anton;Lehnert Wolfgang;Ruhl Günther;Rupp Roland
分类号 H01L29/16;H01L23/29;H01L21/56 主分类号 H01L29/16
代理机构 代理人
主权项 1. A composite wafer comprising: a substrate, comprising a porous carbon substrate core and an encapsulating layer, the encapsulating layer encapsulating the substrate core in an essentially oxygen-tight manner; and a SiC-based functional layer bonded on the substrate, wherein the SiC-based functional layer comprises, at an interface region with the encapsulating layer, at least one of a carbide and a silicide formed by reaction of a portion of the SiC-based functional layer with a carbide-and-silicide-forming metal, and wherein the amount of the carbide-and-silicide-forming metal, integrated over the thickness of the functional layer, is 10−4 mg/cm2 to 0.1 mg/cm.
地址 Neubiberg DE