发明名称 |
Composite Wafer and a Method for Manufacturing Same |
摘要 |
A composite wafer includes a substrate and a SiC-based functional layer. The substrate includes a porous carbon substrate core and an encapsulating layer encapsulating the substrate core. The SiC-based functional layer comprises, at an interface region with the encapsulating layer, at least one of: a carbide and a silicide formed by reaction of a portion of the SiC-based functional layer with a carbide-and-silicide-forming metal. An amount of the carbide-and-silicide-forming metal, integrated over the thickness of the functional layer, is 10−4 mg/cm2 to 0.1 mg/cm2. |
申请公布号 |
US2014225125(A1) |
申请公布日期 |
2014.08.14 |
申请号 |
US201313765102 |
申请日期 |
2013.02.12 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
Berger Rudolf;Schulze Hans-Joachim;Mauder Anton;Lehnert Wolfgang;Ruhl Günther;Rupp Roland |
分类号 |
H01L29/16;H01L23/29;H01L21/56 |
主分类号 |
H01L29/16 |
代理机构 |
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代理人 |
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主权项 |
1. A composite wafer comprising:
a substrate, comprising a porous carbon substrate core and an encapsulating layer, the encapsulating layer encapsulating the substrate core in an essentially oxygen-tight manner; and a SiC-based functional layer bonded on the substrate, wherein the SiC-based functional layer comprises, at an interface region with the encapsulating layer, at least one of a carbide and a silicide formed by reaction of a portion of the SiC-based functional layer with a carbide-and-silicide-forming metal, and wherein the amount of the carbide-and-silicide-forming metal, integrated over the thickness of the functional layer, is 10−4 mg/cm2 to 0.1 mg/cm. |
地址 |
Neubiberg DE |