发明名称 SYSTEM AND METHOD FOR INSPECTION OF ELECTRICAL CIRCUITS
摘要 A system for inspection of electrical circuits including a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein.
申请公布号 US2013027050(A1) 申请公布日期 2013.01.31
申请号 US201113190926 申请日期 2011.07.26
申请人 PHOTON DYNAMICS, INC;JUNG SAM-SOO;MARTIN RAUL 发明人 JUNG SAM-SOO;MARTIN RAUL
分类号 G01R31/08 主分类号 G01R31/08
代理机构 代理人
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