发明名称 RESISTANCE VARIABLE MEMORY CELL STRUCTURES AND METHODS
摘要 <p>Resistance variable memory cell structures and methods are described herein. One or more resistance variable memory cell structures include a first electrode common to a first and a second resistance variable memory cell, a first vertically oriented resistance variable material having an arcuate top surface in contact with a second electrode and a non-arcuate bottom surface in contact with the first electrode; and a second vertically oriented resistance variable material having an arcuate top surface in contact with a third electrode and a non-arcuate bottom surface in contact with the first electrode.</p>
申请公布号 SG185728(A1) 申请公布日期 2012.12.28
申请号 SG20120086286 申请日期 2011.05.09
申请人 MICRON TECHNOLOGY, INC. 发明人 MARSH, EUGENE, P.;QUICK, TIMOTHY, A.
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