发明名称 Contact Metal for Hybridization and Related Methods
摘要 A contact structure for interconnecting a first substrate to an indium interconnect structure on a second substrate. The contact structure comprises a diffusive layer and a non-oxidizing layer, with a thickness of less than approximately 150 nm, positioned on the diffusive layer for alignment with the indium interconnect.
申请公布号 US2012273951(A1) 申请公布日期 2012.11.01
申请号 US201113231675 申请日期 2011.09.13
申请人 GETTY JONATHAN;HAMPP ANDREAS;RAMIREZ AARON M.;MILLER SCOTT S.;RAYTHEON COMPANY 发明人 GETTY JONATHAN;HAMPP ANDREAS;RAMIREZ AARON M.;MILLER SCOTT S.
分类号 H01L23/532;H01L21/60 主分类号 H01L23/532
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