发明名称 |
STORAGE DEVICE TEMPERATURE SENSING |
摘要 |
A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device transporter. The test slot assembly also includes a temperature sensing assembly. The temperature sensing assembly is arranged to measure a temperature of a storage device by way of physical contact. The test slot assembly also includes a clamping mechanism operatively associated with the housing. The clamping mechanism is operable to move the temperature sensing assembly into contact with a storage device. |
申请公布号 |
WO2011008943(A2) |
申请公布日期 |
2011.01.20 |
申请号 |
WO2010US42122 |
申请日期 |
2010.07.15 |
申请人 |
TERADYNE, INC.;MERROW, BRIAN S.;AKERS, LARRY W. |
发明人 |
MERROW, BRIAN S.;AKERS, LARRY W. |
分类号 |
G11B20/18;G01R31/26;H01L21/677 |
主分类号 |
G11B20/18 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|