METHOD FOR MANUFACTURING RFID TAG CHIP

摘要

A method for manufacturing an RFID tag chip is provided to increase the number of the RFID tag chips on a wafer and to perform an EDS(Electric Die Sorting) test for the plural RFID tag chips formed on the wafer by probing only one test chip. A method for manufacturing an RFID tag chip includes the following several steps. Plural RFID tag chips(40) and one test chip(50) are formed on a wafer wherein the test chip forms various kinds of test circuit layouts and plural test pads which enables tests to be performed for the plural RFID tag chips. The plural RFID tag chips, tested by the test chip, form a tag chip pad(41) connected to a test pad(51) and a test line(53) formed in the test chip. In order to perform an EDS test for the plural RFID tag chips, probing one test chip connected to the plural RFID tag chips via the test line is performed. The test line for connecting the test chip to the RFID tag chips is formed on a scribe lane.