发明名称 METHOD OF MANUFACTURING PHASE- CHANGEABLE MEMORY DEVICE
摘要 <p>A method of manufacturing a phase change memory device is provided to prevent an interface of a phase change material film pattern from being contaminated by forming first and second capping films on the phase change material film pattern. An insulation film pattern(130) having an opening is formed on a substrate(100). Lower electrodes(140) for burying the opening are formed. A phase change material film pattern(150) and an upper electrode film pattern(160), which is connected to the lower electrodes, are laminated in a structure. A first capping film(190) is formed along a surface of the insulation film pattern of the structure. A second capping film(200) covers the first capping film, such that a void is generated between the structures.</p>
申请公布号 KR20080072296(A) 申请公布日期 2008.08.06
申请号 KR20070010823 申请日期 2007.02.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, DO HYUNG;KIM, SHIN HYE;LEE, JU BUM;PARK, MIN YOUNG;CHUNG, JAE KYO;SONG, HEUNG SEOP
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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