发明名称 Voltage-controlled semiconductor structure, resistor, and manufacturing processes thereof
摘要 Voltage-controlled semiconductor structures, voltage-controlled resistors, and manufacturing processes are provided. The semiconductor structure comprises a substrate, a first doped well, and a second doped well. The substrate is doped with a first type of ions. The first doped well is with a second type of ions and is formed in the substrate. The second doped well is with the second type of ions and is formed in the substrate. The first type of ions and the second type of ions are complementary. A resistor is formed between the first doped well and the second doped well. A resistivity of the resistor is controlled by a differential voltage. A resistivity of the resistor relates to a first depth of the first doped well, a second depth of the second doped well, and a distance between the first doped well and the second doped well. The resistivity of the resistor is higher than that of a well resistor formed in a single doped well with the second type of ions.
申请公布号 US2008042241(A1) 申请公布日期 2008.02.21
申请号 US20060507293 申请日期 2006.08.21
申请人 SYSTEM GENERAL CORPORATION 发明人 CHIANG CHIU-CHIH;HUANG CHIH-FENG
分类号 H01L29/00;H01L21/20 主分类号 H01L29/00
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