发明名称 FLASH MEMORY ELEMENT, AND METHOD OF MANUFACTURING SAME
摘要 PROBLEM TO BE SOLVED: To provide a flash memory element for reducing an interference effect, and to provide a method of manufacturing the flash memory element. SOLUTION: There is provided the flash memory element including: a semiconductor substrate having an active region defined by element isolation films which are unidirectionally arranged; a control gate line which is arranged in the perpendicular direction to the element isolation films; floating gates which are formed on an active region at a lower portion of the control gate line; and an island polysilicon line which is formed in the shape of a line along an arrangement direction of the element isolation film in the element isolation film, wherein a voltage is impressed so as to be able to prevent an interference between the floating gates which adjoin each other through the element isolation films. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007180477(A) 申请公布日期 2007.07.12
申请号 JP20060169500 申请日期 2006.06.20
申请人 HYNIX SEMICONDUCTOR INC 发明人 RI KONU
分类号 H01L21/8247;H01L21/76;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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