发明名称 Method for making a semiconductor device having a high-k gate dielectric
摘要 A method for making a semiconductor device is described. That method includes forming on a substrate a dielectric layer that has a dielectric constant that is greater than the dielectric constant of silicon dioxide. The dielectric layer is modified so that it will be compatible with a gate electrode to be formed on the dielectric layer, and then a gate electrode is formed on the dielectric layer.
申请公布号 US7166505(B2) 申请公布日期 2007.01.23
申请号 US20040943661 申请日期 2004.09.16
申请人 INTEL CORPORATION 发明人 CHAU ROBERT;ARGHAVANI REZA;DOCZY MARK
分类号 H01L21/8242;H01L21/28;H01L21/316;H01L21/335;H01L21/8232;H01L29/51 主分类号 H01L21/8242
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