| 摘要 |
An integrated circuit and method for testing memory on that integrated circuit are provided. The integrated circuit comprises processing logic operable to perform data processing operations on data, and a number of memory units operable to store data for access by the processing logic. A memory test controller is also provided which is operable to execute test events in order to seek to detect any memory defects in the number of memory units. The memory test controller comprises a storage operable to store event defining information for each of a plurality of test events forming a sequence of test events to be executed, and an interface which, during a single programming operation, receives the event defining information for each of the plurality of test events and causes that event defining information to be stored in the storage. Event processing logic within the memory test controller is then operable, following the single programming operation, to execute the sequence of test events. This provides an efficient technique for enabling a sequence of test events to be programmed at run time.
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