发明名称 LAYOUT MODIFICATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To solve problems in semiconductor LSI, such as reduction of crosstalk and electric power consumption, timing optimization and improvement of chip yield, which are critical for chip performance and cost reduction among various problems caused by wiring. SOLUTION: To optimize wiring intervals, the degree of balance between wiring is defined. An evaluation function, in which weight coefficients are provided for the product of wiring lengths that corresponds to original wiring intervals, is used and optimization is realized by minimizing or maximizing the value of the function. In addition, a function that expresses yield, which measures defect density depending on the value of wiring intervals, is also used to calculate wiring balance that improves yield. These technologies realize timing optimization and layout to reduce crosstalk for LSI chips, and also generate layout patterns to improve yield, so that they are very useful. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005301799(A) 申请公布日期 2005.10.27
申请号 JP20040118939 申请日期 2004.04.14
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KAWAKAMI YOSHIYUKI
分类号 G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址