| 摘要 |
An apparatus and method are provided for testing and sorting semiconductor dies based on performance characteristics. A tester is provided that supplies a pulse to an oscillator fabricated in association with a die under test. A counter is provided which counts oscillations of the oscillator to a predetermined value. Once the counter counts to the predetermined value, it provides a signal to the tester. The tester determines the elapsed time between when the oscillator is activated and when the signal is received from the counter and determines the frequency of the oscillator from the elapsed time.
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