发明名称 METHOD FOR FORMING INTERLAYER DIELECTRIC HAVING LOW DIELECTRIC CONSTANT
摘要 PURPOSE: A method for forming an interlayer dielectric having low dielectric constant is provided to be capable of preventing the generation of polymer and controlling the size of a pore by using an interlayer dielectric having uniformly distributed organic material. CONSTITUTION: A lower metal wiring(33) is formed at the upper portion of a semiconductor substrate having predetermined lower structures. An interlayer dielectric(35) is formed on the resultant structure by spin-coating silica sol compound containing organic material(36) using an organic templating process. After forming a via contact hole(37) by etching the interlayer dielectric(35) for exposing the lower metal wiring(33), an upper metal wiring is connected through the via contact hole(37) to the lower metal wiring(33). A plurality of pores are formed by removing the organic matter(36) of the interlayer dielectric(35) using a heat treatment. At this time, the size of the pore is determined by that of the organic material(36).
申请公布号 KR20030037350(A) 申请公布日期 2003.05.14
申请号 KR20010067852 申请日期 2001.11.01
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, JIN YEON
分类号 H01L21/3105;(IPC1-7):H01L21/310 主分类号 H01L21/3105
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