发明名称 METHOD AND DEVICE FOR INSPECTING APPEARANCE OF SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for inspecting the upper and lower surfaces of a part simultaneously without mutual interference by eliminating such problems with the automatic appearance inspection for parts mounted on both surfaces of a printed board that a setup must be performed after an upper surface inspection and then a lower surface must be inspected, and part inspection data must be modified when the positions of judgment character strings are shifted due to a difference in production lot of parts. SOLUTION: In this appearance inspection method, it is judged based on photographed images whether specified parts are mounted or not on a printed board having through-holes and having parts mounted on both surfaces thereof. The coordinate positions of a board upper surface imaging start position and a board lower surface imaging start position are set differently from each other, the parts mounted on both surfaces of the board are imaged independently on the upper and lower surfaces thereof, and the parts on the upper and lower surfaces are imaged in a predetermined order. Printing characters on an objective part are taken out and compared with pre-stored specified part characters to determine whether the board mounted part is correct or not.
申请公布号 JP2003099758(A) 申请公布日期 2003.04.04
申请号 JP20010290978 申请日期 2001.09.25
申请人 HITACHI LTD;HITACHI INFORMATION & CONTROL SYSTEMS INC 发明人 NISHINO SHIGEO;MAGARA MASATOSHI;MORITA HIROSHI
分类号 G01N21/956;G06T1/00;G06T7/00 主分类号 G01N21/956
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