| 摘要 |
PROBLEM TO BE SOLVED: To provide a memory test device which can perform a test by an interleaving system between banks and distinguishing correctly a charge 1 region and a charge 0 region. SOLUTION: This device is provided with a pattern-select section taking out selectively plural pattern signals outputted for each same time slot by a pattern generating section in accordance with an input pin of a memory to be tested, plural cycle delaying sections giving time difference for arranging in the direction of time series to each of pattern signals selected by this plural pattern-select sections, and a multiplxer multiplexing a pattern signal delayed by this plural cycle delaying section.
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