| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of inspecting parts and a device therefor in which parts undergo appearance inspection individually and at a high speed without needing pats segmenting control, which can sort at a high speed the parts according to normal/defective condition of inspection. SOLUTION: This device is provided with a linear parts feeder 4 for conveying chip parts 1 in series, a suction nozzle 7 installed opposite to the terminating part of the linear parts feeder 4, two suction paths 12a, 12b branched and formed on the downstream side of the suction nozzle, a CCD camera 6 for picking up the image of the chip parts 1 individually flying toward the suction nozzle 7, a picture inspecting part 17 for subjecting the image picked up by the CCD camera 6 to high speed treatment to output signals of normal/ defective condition decision, and a sorting unit 13 for dividing the chip parts 1 among two suction paths 12a, 12b based on the normal/defective condition deciding signal outputted from the image inspecting part 17.
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