发明名称 INSPECTING DEVICE FOR NON-CONTACT IC CARD AND ITS METHOD
摘要 PROBLEM TO BE SOLVED: To improve the productivity and quality by preventing an interference between detecting heads so as to surely confirm operation and a function without making a trouble in a device in the state of a card base material sheet state, where inlets are plurally alignadly arranged, before making a card even in the case of generating a defective connection of an IC module and an antenna connection part or incorporation of a defective IC module in the production of a noncontact IC card so as to prevent production of a defective card and to reduce wasteful consumption of materials, the increase of the producing cost and incorporation of detective cards into a finished card. SOLUTION: With respect to the card base material sheet obtained by aligning arranging plural inlets for the non-contact IC card obtained by integrating the IC module and the antenna, etc., 71 of a non-contact element on a sheet, the inspecting device for a non-contact IC card and its method prepare plural detecting head parts, selectively switch these to successively inspect the inlets for the non-contact IC card and use a means 72 preventing interference between detecting head parts 72 adjacent to each other.
申请公布号 JP2000132643(A) 申请公布日期 2000.05.12
申请号 JP19980302113 申请日期 1998.10.23
申请人 TOPPAN PRINTING CO LTD 发明人 IGARASHI SUSUMU;NAKAJIMA HIDEMI;EMORI SUSUMU;KOBAYASHI KAZUO
分类号 G06K19/07;B42D15/10;G06K17/00 主分类号 G06K19/07
代理机构 代理人
主权项
地址