发明名称 SURFACE EXAMINATION DEVICE
摘要 PURPOSE: A surface examination device is provided to simplify the constitution of a surface examination device, and to simplify a side examination of an object. CONSTITUTION: The surface examination device constituted to examine by reflecting into a display unit(51) after photographing an examining object(O) by a CCD camera contains; one CCD camera(1) installed to locate on the upper face of the object; an optic sense lens(2) installed to be able to see the upper face and the side in the display unit(51) at the same time by distorting the examining object(O) by installing in the front face of the CCD camera.
申请公布号 KR20000007504(A) 申请公布日期 2000.02.07
申请号 KR19980026876 申请日期 1998.07.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HA, MOON SU;KO, YOUNG WOO
分类号 H04N17/00;(IPC1-7):H04N17/00 主分类号 H04N17/00
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