发明名称 Test probe for measuring instrument
摘要 The probe (3) has a test prod (12) with a proximal end connected to the body of the instrument by a lead (11) with a covered section (11b). A handle (13) protects a section which forms a connection between the test prod and lead and which seats tightly on the proximal end of the test probe. The handle has a grip (43) which holds the distal end of the covered section of the lead and has a stress relief section (36) firmly secured to the grip to prevent the lead being pulled out of the handle.
申请公布号 DE19807913(A1) 申请公布日期 1998.08.27
申请号 DE19981007913 申请日期 1998.02.25
申请人 SEIKO EPSON CORP., TOKIO/TOKYO, JP 发明人 KAMIYA, MANABU, SUWA, NAGANO, JP
分类号 G01R1/06;G01R1/067;G01R1/073;G01R15/12;H01R11/18;H01R13/58;(IPC1-7):H01R11/18;G01D21/00;H01R4/18;H01R4/28 主分类号 G01R1/06
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