发明名称 Scintillation detector with photosensor adjacent to signal processor - both formed of amorphous or polycrystalline silicon of insulating coating inside one sidewall of open collimator
摘要 The beam (9) of radiation falls on a scintillator (3) in the base of a collimating collector (8) between two sidewalls (6,7). The scintillation produced is converted by the photosensor (4) into electrical signals for evaluation by the processor (5). The support (6) on which the photosensor (4) and processor (5) are mounted together forms one wall of the collector (8). It may contain Ta, W or Mo and is coated with an insulating layer on which the components (4,5) are juxtaposed. USE/ADVANTAGE - For computer tomography equipment or luggage checking appts. Simplified by elimination of separate supports for photosensor and processor.
申请公布号 DE4230651(A1) 申请公布日期 1993.04.01
申请号 DE19924230651 申请日期 1992.09.14
申请人 SIEMENS AG, 8000 MUENCHEN, DE 发明人 SCHULZ, REINER, DIPL.-PHYS. DR.;BIRKNER, JOHANN, 8520 ERLANGEN, DE;HENNERICI, WOLFGANG, DIPL.-PHYS. DR., 6228 ELTVILLE, DE;LINDNER, ROLF, DIPL.-PHYS. DR., 8520 ERLANGEN, DE;KLEIN, SIGISMUND, 8500 NUERNBERG, DE;HOLZENKAEMPFER, ENNO, DIPL.-PHYS. DR., 6204 TAUNUSSTEIN, DE
分类号 G01T1/202 主分类号 G01T1/202
代理机构 代理人
主权项
地址