发明名称 FORMING METHOD FOR OXIDE FILM
摘要 PURPOSE:To treat sheets under a normal pressure at a low temperature by feeding gas containing ozone to organosilicon polymer coating a substrate to be treated. CONSTITUTION:A semiconductor wafer 12 is uniformly coated with a film such as a liquid organosilicon polymer film. A heater 15 contained in a placing base 13 is controlled to heat the wafer 12. Then, oxygen gas containing ozone supplied from an oxygen supply source 23 and an ozone generator 24 is regulated at its flow rate by a gas flowrate regulator 25, and flows from a gas flowing section 20 toward the wafer 12. Accordingly, the ozone is heated by the heated wafer 12 and an atmosphere therearound to be decomposed, thereby generating oxygen atom radical. Thus, since an oxide film can be formed at a high speed under a normal pressure at a low temperature, it can cope with multilayered interconnection and can form the oxide film at a low cost in a high efficiency.
申请公布号 JPS63308322(A) 申请公布日期 1988.12.15
申请号 JP19870144927 申请日期 1987.06.10
申请人 TOKYO ELECTRON LTD 发明人 MATSUMURA KIMIHARU;SHIGAKI KEISUKE;SERIKAWA SEIICHI
分类号 H01L21/312;H01L21/316 主分类号 H01L21/312
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