发明名称 Method of growing heteroepitaxial InP on Si using Sn substrate implantation
摘要 When a semiconductor device is produced by growing epitaxially a compound semiconductor layer on a Si or Ge substrate, lattice matching between the substrate crystal and the compound semiconductor layer to be formed on the substrate can be improved by ion-implanting an ion species element, which increases the lattice constant of Si or Ge as the substrate, into the Si or Ge substrate in order to increase its lattice constant. In comparison with conventional semiconductor devices using Si or Ge into which ion implantation is not made, the semiconductor device produced by the method described above can improve remarkably its characteristics. In the case of a semiconductor laser device, for example, its threshold value drops drastically and its service life can be prolonged remarkably.
申请公布号 US4766092(A) 申请公布日期 1988.08.23
申请号 US19860937019 申请日期 1986.12.02
申请人 HITACHI, LTD. 发明人 KURODA, TAKAO;HIRUMA, KENJI;MATSUMURA, HIROYOSHI
分类号 H01L21/20;H01L21/203;H01L21/205;H01L21/265;H01S5/00;(IPC1-7):H01L21/20 主分类号 H01L21/20
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