发明名称 |
Optical particle analysis |
摘要 |
A system and method for determining particle size, shape, and/or quantity. The particle can alter the polarization state of two oppositely-polarized light beams, thus allowing the light beams to interfere with each other. An interference pattern from interference of the two light beams can be captured by a CCD. The interference pattern can be analyzed to determine size, shape, and/or quantity. |
申请公布号 |
US9448156(B2) |
申请公布日期 |
2016.09.20 |
申请号 |
US201514606848 |
申请日期 |
2015.01.27 |
申请人 |
Moxtek, Inc. |
发明人 |
Modawar Faris |
分类号 |
G01N21/21;G01N15/14;G01N21/53;G01N21/05 |
主分类号 |
G01N21/21 |
代理机构 |
Thorpe, North & Western, LLP |
代理人 |
Thorpe, North & Western, LLP |
主权项 |
1. A particle analysis system comprising:
a. an unpolarized light source directed towards a charge couple device camera (CCD); b. a fluid-flow region disposed between the light source and the CCD; c. a light-blocking screen disposed between the light source and the fluid-flow region; and d. two polarization devices, oppositely-polarized with respect to each other, disposed in the screen, and capable of allowing light from the light source to pass through the polarization devices, through the fluid-flow region, and onto the CCD. |
地址 |
Orem UT US |