发明名称 Optical particle analysis
摘要 A system and method for determining particle size, shape, and/or quantity. The particle can alter the polarization state of two oppositely-polarized light beams, thus allowing the light beams to interfere with each other. An interference pattern from interference of the two light beams can be captured by a CCD. The interference pattern can be analyzed to determine size, shape, and/or quantity.
申请公布号 US9448156(B2) 申请公布日期 2016.09.20
申请号 US201514606848 申请日期 2015.01.27
申请人 Moxtek, Inc. 发明人 Modawar Faris
分类号 G01N21/21;G01N15/14;G01N21/53;G01N21/05 主分类号 G01N21/21
代理机构 Thorpe, North & Western, LLP 代理人 Thorpe, North & Western, LLP
主权项 1. A particle analysis system comprising: a. an unpolarized light source directed towards a charge couple device camera (CCD); b. a fluid-flow region disposed between the light source and the CCD; c. a light-blocking screen disposed between the light source and the fluid-flow region; and d. two polarization devices, oppositely-polarized with respect to each other, disposed in the screen, and capable of allowing light from the light source to pass through the polarization devices, through the fluid-flow region, and onto the CCD.
地址 Orem UT US