发明名称 |
INTER-LEVEL CONNECTION FOR MULTI-LAYER STRUCTURES |
摘要 |
Systems and methods are provided for fabricating a semiconductor device structure. An example semiconductor device structure includes a first device layer, a second device layer and an inter-level connection structure. The first device layer includes a first conductive layer and a first dielectric layer formed on the first conductive layer, the first device layer being formed on a substrate. The second device layer includes a second conductive layer, the second device layer being formed on the first device layer. The inter-level connection structure includes one or more conductive materials and configured to electrically connect to the first conductive layer and the second conductive layer, the inter-level connection structure penetrating at least part of the first dielectric layer. The first conductive layer is configured to electrically connect to a first electrode structure of a first semiconductor device within the first device layer. |
申请公布号 |
US2015137249(A1) |
申请公布日期 |
2015.05.21 |
申请号 |
US201314080940 |
申请日期 |
2013.11.15 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
LIN YI-TANG;WANN CLEMENT HSINGJEN;CHEN NENG-KUO |
分类号 |
H01L27/06;H01L27/088;H01L23/522 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device structure comprising:
a substrate; a first device layer including a first conductive layer and a first dielectric layer formed on the first conductive layer, the first device layer being formed on the substrate; a second device layer including a second conductive layer, the second device layer being formed on the first device layer; and a first inter-level connection structure including one or more conductive materials and configured to electrically connect to the first conductive layer and the second conductive layer, the first inter-level connection structure penetrating at least part of the first dielectric layer; wherein the first conductive layer is configured to electrically connect to a first electrode structure of a first semiconductor device within the first device layer. |
地址 |
Hsinchu TW |