发明名称 INTER-LEVEL CONNECTION FOR MULTI-LAYER STRUCTURES
摘要 Systems and methods are provided for fabricating a semiconductor device structure. An example semiconductor device structure includes a first device layer, a second device layer and an inter-level connection structure. The first device layer includes a first conductive layer and a first dielectric layer formed on the first conductive layer, the first device layer being formed on a substrate. The second device layer includes a second conductive layer, the second device layer being formed on the first device layer. The inter-level connection structure includes one or more conductive materials and configured to electrically connect to the first conductive layer and the second conductive layer, the inter-level connection structure penetrating at least part of the first dielectric layer. The first conductive layer is configured to electrically connect to a first electrode structure of a first semiconductor device within the first device layer.
申请公布号 US2015137249(A1) 申请公布日期 2015.05.21
申请号 US201314080940 申请日期 2013.11.15
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 LIN YI-TANG;WANN CLEMENT HSINGJEN;CHEN NENG-KUO
分类号 H01L27/06;H01L27/088;H01L23/522 主分类号 H01L27/06
代理机构 代理人
主权项 1. A semiconductor device structure comprising: a substrate; a first device layer including a first conductive layer and a first dielectric layer formed on the first conductive layer, the first device layer being formed on the substrate; a second device layer including a second conductive layer, the second device layer being formed on the first device layer; and a first inter-level connection structure including one or more conductive materials and configured to electrically connect to the first conductive layer and the second conductive layer, the first inter-level connection structure penetrating at least part of the first dielectric layer; wherein the first conductive layer is configured to electrically connect to a first electrode structure of a first semiconductor device within the first device layer.
地址 Hsinchu TW