发明名称 FILM DEPOSITION METHOD
摘要 <p>Provided is a film deposition method capable of improving the crystal characteristic near an interface according to the lattice constant of a material that will constitute a thin film to be deposited. Specifically, a substrate is curved relative to the direction along one main surface on which the thin film is to be deposited, according to the lattice constant the material that will constitute the thin film to be deposited and the lattice constant of a material constituting the one main surface. The thin film is deposited on the one main surface of the substrate with the substrate curved.</p>
申请公布号 EP2312616(B1) 申请公布日期 2013.08.07
申请号 EP20090770224 申请日期 2009.06.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 HASHIMOTO, SHIN;TANABE, TATSUYA
分类号 C30B25/02;C30B29/40;H01L21/02 主分类号 C30B25/02
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