发明名称 DEVICE FOR RAISING TEMPERATURE AND METHOD FOR TESTING AT ELEVATED TEMPERATURE
摘要 An external DC power supply 2 feeds a power supply voltage to a drain electrode of a MOSFET 10 constituted by silicon carbide (SiC), and a variable bias voltage generated from thus fed power supply voltage is applied to a gate electrode 13, so as to raise the temperature of the MOSFET 10. To a voltage divided by resistors R3, R4 from the power supply voltage, a change in a voltage divided by resistors R1, R2 from the power supply voltage is amplified by a predetermined negative amplification factor in the MOSFET 20 and added at a drain electrode 21, so that the drain electrode 21 attains a fixed voltage, whereby the bias voltage is held constant.
申请公布号 US2013128923(A1) 申请公布日期 2013.05.23
申请号 US201113813111 申请日期 2011.07.26
申请人 SAWADA KENICHI;SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 SAWADA KENICHI
分类号 G01K7/01;H01L29/16 主分类号 G01K7/01
代理机构 代理人
主权项
地址