| 摘要 |
During the radiographic inspection of components by X-rays for better detection of defects, preferably automated, an uneven surface topography (2) of the component (1) is covered with a smoothening layer (8) made of a material whose volume-specific radiation absorption corresponds to that of the component material, so that a decrease of radiation absorption or an increase in radiation intensity due to the uneven surface topography is reduced to accentuate a radiation effect caused by internal material defects. |
