发明名称 PATTERN SHAPE EVALUATING APPARATUS
摘要 PROBLEM TO BE SOLVED: To accurately and rapidly evaluate the degree of edge roughness from an SEM observation image of a fine line pattern with much noise, by calculating the contribution of the random noise of an apparatus, of a measured index of roughness, based on one image data item and calculating the degree of edge roughness actually existing in a pattern by subtracting the roughness caused by the apparatus from a measurement value of the edge roughness index. SOLUTION: A quantity (dispersion value) of a distribution of an edge position due to random noise is reduced statistically to 1/N when N edge position data items are averaged. Using this property, the single page image is averaged in a vertical direction with various values of parameter S, and then the edge roughness index is calculated. The S-dependence of the edge roughness index is analyzed and a term of a dispersion value directly proportional to 1/S is determined as being due to noise. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011180159(A) 申请公布日期 2011.09.15
申请号 JP20110140088 申请日期 2011.06.24
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YAMAGUCHI ATSUKO;FUKUDA HIROSHI;KOMURO OSAMU;KAWADA HIROKI
分类号 G01B15/04;G01B15/00 主分类号 G01B15/04
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