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发明名称
TEST WAFER UNIT AND TEST SYSTEM
摘要
申请公布号
KR20110005285(A)
申请公布日期
2011.01.17
申请号
KR20107026134
申请日期
2008.06.02
申请人
ADVANTEST CORPORATION
发明人
WATANABE DAISUKE;OKAYASU TOSHIYUKI
分类号
G01R31/28;H01L21/66
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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