发明名称 Atomic layer deposition method
摘要 An atomic layer deposition method includes positioning a semiconductor substrate within an atomic layer deposition chamber. A first precursor gas is flowed to the substrate within the atomic layer deposition chamber effective to form a first monolayer on the substrate. After forming the first monolayer, a reactive intermediate gas is flowed to the substrate within the deposition chamber. The reactive intermediate gas is capable of reaction with an intermediate reaction by-product from the first precursor flowing under conditions of the reactive intermediate gas flowing. After flowing the reactive intermediate gas, a second precursor gas is flowed to the substrate within the deposition chamber effective to form a second monolayer on the first monolayer. Other aspects and implementations are contemplated.
申请公布号 US7128787(B2) 申请公布日期 2006.10.31
申请号 US20040956925 申请日期 2004.09.30
申请人 MICRON TECHNOLOGY, INC. 发明人 CASTOVILLO PAUL J.;BASCERI CEM;DERDERIAN GARO J.;SANDHU GURTEJ S.
分类号 C23C16/34;C30B25/14;C23C14/06;C23C14/08;C23C16/40;C23C16/44;C23C16/455;C30B25/16;H01L21/285;H01L21/316;H01L21/768 主分类号 C23C16/34
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