发明名称 Method of forming a dual-sided capacitor
摘要 A dual-sided HSG capacitor and a method of fabrication are disclosed. A thin native oxide layer is formed between a doped polycrystalline layer and a layer of hemispherical grained polysilicon (HSG) as part of a dual-sided lower capacitor electrode. Prior to the dielectric formation, the lower capacitor electrode may be optionally annealed to improve capacitance.
申请公布号 US7071056(B2) 申请公布日期 2006.07.04
申请号 US20040895130 申请日期 2004.07.21
申请人 发明人
分类号 H01L21/8242;H01G4/005;H01L21/02;H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L21/8242
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