发明名称 Methods of forming power semiconductor devices having laterally extending base shielding regions
摘要 Methods of forming power semiconductor devices include forming a semiconductor substrate having a drift region of first conductivity type therein and a transition region of first conductivity type that extends between the drift region and a first surface of the semiconductor substrate. A gate electrode is formed on the first surface. Base and base shielding region dopants are implanted into the transition region using the gate electrode as an implant mask. A plurality of annealing steps are performed so that the base shielding region dopants are driven in laterally and vertically to substantially their full and final depth within the substrate and thereby define first and second base shielding regions that constrict a neck of the transition region to a minimum width.
申请公布号 US7041559(B2) 申请公布日期 2006.05.09
申请号 US20040936757 申请日期 2004.09.08
申请人 SILICON SEMICONDUCTOR CORPORATION 发明人 BALIGA BANTVAL JAYANT
分类号 H01L21/336;H01L21/332;H01L21/4763;H01L21/76;H01L29/06;H01L29/08;H01L29/10;H01L29/40;H01L29/417;H01L29/78;H01L29/872 主分类号 H01L21/336
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