| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of measuring an optical spot which enables conducting spot measurement even for a lens system having an NA of exceeding 1.4, and a method of manufacturing an optical pickup capable of aligning its optical axis with an SIL by easily moving a luminous point of a light source and of focusing on the surface of the SIL. SOLUTION: Since the performance of the SIL 6 of the optical pickup 1 to be measured is that a spot 25 is imaged on a flat surface of the SIL 6, and that this image the spot 25 in the vicinity of the flat surface of the SIL 6 are measured by a probe 11 of an SNOM 10, an accurate spot image and an intensity distribution can be obtained for the SIL 6 having even an NA of exceeding 1.4. Moreover, since nearfield leaked from the surface of the SIL 6 is actually measured, conditions of a light beam in an actual writing/reading position of the SIL 6 can be obtained. COPYRIGHT: (C)2003,JPO
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