发明名称 Data inspection method and apparatus
摘要 A data inspection method includes the steps of (a) writing original test data in a memory region, (b) reading the test data from the memory region, and (c) comparing the read test data with the original test data, so as to make a data inspection. The test data is formed by a plurality of cell data. Each of the cell data includes a delimiter indicating a boundary between two adjacent cell data, a cell number indicating an order within the test data, a cell data length indicating a data length of the cell data, and pattern data. Each of the cell data in the test data has a cell data length which is variable.
申请公布号 US6499119(B1) 申请公布日期 2002.12.24
申请号 US19990455372 申请日期 1999.12.06
申请人 FUJITSU LIMITED 发明人 ORITA SUEHIRO;KOBORI MASAO
分类号 G01R31/28;G06F11/22;G06F12/08;G06F12/16;G11B20/18;G11C29/10;G11C29/44;(IPC1-7):G11C29/00 主分类号 G01R31/28
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