发明名称 CAPACITOR OF SEMICONDUCTOR ELEMENT AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a capacitor of a semiconductor element, having a TaON dielectric film capable of reducing a leakage current, while assuring high capacitance. SOLUTION: A method for manufacturing the capacitor of the semiconductor element comprises a step of vapor depositing a Ta metal film 28 on a semiconductor substrate 20, a step of crystallizing the Ta metal film 28, a step of forming a lower electrode 30 by patterning a prescribed part of the film 28, a step of forming the TaON film on the electrode 30, a step of forming an upper electrode 34 on the TaON film 32.
申请公布号 JP2002057223(A) 申请公布日期 2002.02.22
申请号 JP20010160382 申请日期 2001.05.29
申请人 HYNIX SEMICONDUCTOR INC 发明人 KAN SHOKEI
分类号 C23C14/34;C23C16/30;H01L21/02;H01L21/314;H01L21/316;H01L21/8242;H01L27/108 主分类号 C23C14/34
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