发明名称 Completely buried contact holes
摘要 A method for forming a completely buried contact hole and a semiconductor device having a completely buried contact hole in an interconnection structure is disclosed. The completely buried contact hole includes a first insulating layer of a first thermal conductivity having a contact hole formed therein. A region of material of a second thermal conductivity formed in the first insulating layer adjacent the location of the contact hole. The second thermal conductivity is greater than the first thermal conductivity such that the thermal conductivity of the region of material is greater than the thermal conductivity of the insulating layer. A metal is formed in the hole which completely buries the contact hole. The method includes forming in an insulator adjacent a contact hole a region of material of a higher thermal conductivity than the insulating layer, depositing a metal in the contact hole and heating the metal, the insulating layer and the region of material of a higher thermal conductivity to flow the metal into the contact hole so as to completely bury the contact hole.
申请公布号 US5982039(A) 申请公布日期 1999.11.09
申请号 US19980048391 申请日期 1998.03.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, WOO-SANG;CHOI, GIL-HEYUN;PARK, JI-SOON;KIM, BYEONG-JUN
分类号 H01L23/522;H01L21/28;H01L21/768;H01L23/485;H01L23/532;(IPC1-7):H01L23/485 主分类号 H01L23/522
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