ARRANGEMENT FOR MEASURING HEAT-VARIABLE DC AND/OR HIGH FREQUENCY PARAMETERS OF THE SEMICONDUCTOR DEVICES IN THE COURSE OF OPERATION AND THERMOSTAT FOR OPERATING AND/OR MEASURING SEMICONDUCTOR DEVICES IN A FILED OF VARIABLE TEMPERATURE,申请号HU19910000699-传众专利搜索

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发明名称	ARRANGEMENT FOR MEASURING HEAT-VARIABLE DC AND/OR HIGH FREQUENCY PARAMETERS OF THE SEMICONDUCTOR DEVICES IN THE COURSE OF OPERATION AND THERMOSTAT FOR OPERATING AND/OR MEASURING SEMICONDUCTOR DEVICES IN A FILED OF VARIABLE TEMPERATURE
摘要
申请公布号	HU209212(B)	申请公布日期	1994.03.28
申请号	HU19910000699	申请日期	1991.03.05
申请人	MTA MUESZAKI FIZIKAI KUTATO INTEZETE	发明人	SZENTPALI,BELA;REISINGER,GYOERGY;REISZ,FERENC;LUKACS,LASZLO
分类号	G01R31/26;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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