Self-testing facilities of off-chip drivers for processor and the like
摘要
Self-test techniques for checking driver circuits connected to a bus are described that particularly involve the detection and isolation of failures in off-chip-drivers and connections.
申请公布号
US4558447(A)
申请公布日期
1985.12.10
申请号
US19830470033
申请日期
1983.02.28
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人
FREEMAN, JOSEPH W.;KRAFT, WAYNE R.;KURTZ, HOBART L.;MAGRISSO, ISRAEL B.
