发明名称 TEST SYSTEM FOR INTEGRATED CIRCUIT
摘要 PURPOSE:To obtain the test system which conducts both an operation test and a DC test of an input circuit connected to an external circuit by inverting and outputting the output data of the input circuit to the external terminal. CONSTITUTION:The input terminal of the input circuit 7 and the output terminal of an output circuit 8 are connected to the external terminal 9 in common. Further, a selecting circuit 10 is used to select and output the input data of the input circuit 7 and when the output data of the input circuit 7 is selected and outputted, the input data of the external terminal 9 is inverted in phase and outputted selectively. Consequently, it is discriminated whether or not the data in a next clock cycle has the same polarity with the input data, thereby testing the input circuit.
申请公布号 JPH01259274(A) 申请公布日期 1989.10.16
申请号 JP19880086871 申请日期 1988.04.08
申请人 FUJITSU LTD 发明人 MATSUSHITA SHOJI;KIMURA MASAHARU
分类号 G01R31/26;G01R31/28;G01R31/3185 主分类号 G01R31/26
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