发明名称 Structure for preventing leakage of a semiconductor device
摘要 A structure for preventing leakage of a semiconductor device is provided. The structure comprises a conductive layer, for shielding the features beneath thereof, located under a conductive line which crosses over a region having high voltage device. The conductive layer is wider than the conductive line.
申请公布号 US7598585(B2) 申请公布日期 2009.10.06
申请号 US20060420198 申请日期 2006.05.24
申请人 HIMAX TECHNOLOGIES LIMITED 发明人 WU CHAN-LIANG
分类号 H01L23/58;H01L23/552;H01L29/00 主分类号 H01L23/58
代理机构 代理人
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