发明名称 DICTIONARY LEARNING DEVICE, PATTERN MATCHING APPARATUS, METHOD FOR LEARNING DICTIONARY AND STORAGE MEDIUM
摘要 Provided is a technology which enables further improvement of the accuracy of the determination in the pattern matching processing.;A dictionary learning device 1 includes a score calculation unit (score calculation means) 2 and a learning unit (learning means) 3. The score calculation unit 2 calculates a matching score representing a similarity-degree between a sample pattern, which is a sample of a pattern which is likely to be subjected to a pattern matching processing, and a degradation pattern resulting from a degrading processing on the sample pattern. The learning unit 3 learns a quality dictionary based on the calculated matching score and the degradation pattern. The quality dictionary is a dictionary which is used in a processing to evaluate a degradation degree (quality) of a matching target pattern of being pattern of an object on which the pattern matching processing is carried out. Through evaluating the degradation degree (quality) of the matching target pattern by using the generated quality dictionary by the dictionary learning device 1, the result of the evaluation of the matching target pattern becomes a result in view of the pattern matching processing.
申请公布号 US2014301634(A1) 申请公布日期 2014.10.09
申请号 US201214364467 申请日期 2012.12.12
申请人 ISHII Masato;SHIMOSAKA Naoki;NEC CORPORATION 发明人 Ishii Masato
分类号 G06K9/62 主分类号 G06K9/62
代理机构 代理人
主权项 1. A dictionary learning device comprising: a score calculation unit that calculates a matching score representing a similarity-degree between a sample pattern which is a sample of a pattern which is likely to be subjected to a pattern matching processing and a degradation pattern resulting from a degrading processing on the sample pattern; and learning unit that, based on the calculated matching score and the degradation pattern, learns a quality dictionary which is used in a processing to evaluate a degradation degree of a matching target pattern of being target to be subjected to the pattern matching processing.
地址 Minato-ku, Tokyo JP